self_test_config_t Struct Reference

#include <self_test.h>

Collaboration diagram for self_test_config_t:

Public Attributes
uint8_t	device_count
self_test_device_t	devices [SELF_TEST_MAX_DEVICES]
uint32_t	probe_timeout_ms
uint32_t	retry_interval_ms
uint32_t	heartbeat_interval_ms
uint32_t	battery_interval_ms
uint32_t	battery_max_age_ms
uint32_t	callback_budget_ms
uint32_t	tick_budget_ms
uint8_t	probe_max_attempts
uint8_t	publication_max_attempts
uint32_t	session_timeout_ms

Detailed Description

Definition at line 17 of file self_test.h.

Member Data Documentation

battery_interval_ms

uint32_t self_test_config_t::battery_interval_ms

Definition at line 23 of file self_test.h.

Referenced by config_valid(), test_battery_validity(), test_invalid_inputs(), and test_wraparound().

battery_max_age_ms

uint32_t self_test_config_t::battery_max_age_ms

Definition at line 24 of file self_test.h.

Referenced by config_valid(), and test_invalid_inputs().

callback_budget_ms

uint32_t self_test_config_t::callback_budget_ms

Definition at line 25 of file self_test.h.

Referenced by config_valid(), setup(), test_invalid_inputs(), and test_session_deadline().

device_count

uint8_t self_test_config_t::device_count

Definition at line 18 of file self_test.h.

Referenced by config_valid(), test_deadline_retry_and_unstarted(), test_failure_completes_after_three_attempts(), test_full_inventory_budget(), test_invalid_inputs(), test_missing_and_optional(), test_probe_retry_bounds_and_recovery(), test_reset_and_copied_dependencies(), test_timeout_retry(), and test_wraparound().

devices

self_test_device_t self_test_config_t::devices[SELF_TEST_MAX_DEVICES]

Definition at line 19 of file self_test.h.

Referenced by config_valid(), test_full_inventory_budget(), test_invalid_inputs(), test_missing_and_optional(), and test_session_deadline().

heartbeat_interval_ms

uint32_t self_test_config_t::heartbeat_interval_ms

Definition at line 22 of file self_test.h.

Referenced by config_valid(), test_heartbeat_boundaries_and_gap(), test_invalid_inputs(), and test_pending_timeout_and_fairness().

probe_max_attempts

uint8_t self_test_config_t::probe_max_attempts

Definition at line 27 of file self_test.h.

Referenced by config_valid(), test_deadline_retry_and_unstarted(), test_failure_completes_after_three_attempts(), test_invalid_inputs(), test_malformed_driver_results(), test_pending_timeout_and_fairness(), and test_terminal_results().

probe_timeout_ms

uint32_t self_test_config_t::probe_timeout_ms

Definition at line 20 of file self_test.h.

Referenced by config_valid(), and test_invalid_inputs().

publication_max_attempts

uint8_t self_test_config_t::publication_max_attempts

Definition at line 28 of file self_test.h.

Referenced by config_valid(), and test_invalid_inputs().

retry_interval_ms

uint32_t self_test_config_t::retry_interval_ms

Definition at line 21 of file self_test.h.

Referenced by config_valid(), and test_invalid_inputs().

session_timeout_ms

uint32_t self_test_config_t::session_timeout_ms

Definition at line 30 of file self_test.h.

Referenced by config_valid(), test_deadline_retry_and_unstarted(), test_invalid_inputs(), and test_session_deadline().

tick_budget_ms

uint32_t self_test_config_t::tick_budget_ms

Definition at line 26 of file self_test.h.

Referenced by config_valid(), test_invalid_inputs(), and test_session_deadline().

---

The documentation for this struct was generated from the following file:

• firmware/Flight_Computer/src/app/self_test.h